IEEE journal of solid-state circuits 30(8):947–949 Sun SW, Tsui PGY (1995) Limitation of CMOS supply-voltage scaling by MOSFET threshold-voltage variation. IEEE journal of solid-state circuits 25(2):584–594 Sakurai T, Newton AR (1990) Alpha-power law MOSFET model and its applications to CMOS inverter delay and other formulas. Orouji, Enhancement of a Nanoscale novel Esaki tunneling diode source TFET (ETDS-TFET) for low-voltage operations, silicon, 2547-2556, 11 (6), (2019) IEEE transactions on Electron devices 52(11):2395–2403 IEEE transactions on Electron devices 31(10):1505–1509Īkturk A, Goldsman N, Metze G (2005) Self-consistent modeling of heating and MOSFET performance in 3-D integrated circuits. Jindal RP (1984) Noise associated with distributed resistance of MOSFET gate structures in integrated circuits. IEEE journal of solid-state circuits 29(7):833–835 Wang B, Hellums JR, Sodini CG (1994) MOSFET thermal noise modeling for analog integrated circuits. Ghibaudo G (1988) New method for the extraction of MOSFET parameters.
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